Extension to the Serial Vector Format Specification Supporting Testing of Analog Units of Safety-Critical Embedded Systems

Abstract

In safety-critical embedded systems, the built-in self-test is an important tool to increase reliability. Embedded self-test solutions for digital circuits are much more sophisticated than for analog circuits. In this paper, my goal is to facilitate the built-in self-testing of analog circuit components and subcircuits using the solution described here. I am trying to achieve this by extending the SVF specification used for boundary scan testing of digital circuits. With the extended command set, it is possible to generate excitation current signals to measure the parameters of analog components or subcircuits, and to detect and measure the response voltages of the circuit.